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Efficient Numerical Analysis of Large Planar High Impedance Surface by the Synthetic Function Expansion Technique

L.Matekovits, G.Vecchi, M.Bercigli, M.Bandinelli

Abstract: Application is presented of the Synthetic Function eXpansion (SFX) method to the accurate analysis of devices that incorporate microstrip-technology electromagnetic band-gap structures of large but finite size. The strong reduction of the dimension of the system matrix achieved employing the SFX technique reduces the solution time and the memory occupation, making it possible to analyze large structures on standard computational hardware. Experimental verification confirms the validity of the approach

Published on Microwave and Optical Technology Letters, Vol. 51, N. 11, November 2009