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Population of RAM materials properties data base

A significant quantity of planar samples of RAM, RAS and RAP have been collected for characterization with: Standard Bistatic Measurement of Reflection coefficient (NRL ARCH), Pseudo far field behavior, Monostatic off normal incidence. The purpose is the verification of material properties and the population of IDS frameworks material data base. Characterization has been done by preparing canonical samples (plates, corners); performance degradation assessment has been repeated after simulated environment exposure (salt and UV). Further processing includes statistical characterization.